INDUSTRY MEETS SCIENCE
A 3 day conference to discover state of the art technologies in measurement, explore industrial challenges and uncover the latest innovations for increased performance through:
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a varied conference programme and round tables sessions,
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an exhibition showcasing innovations and solutions,
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technical site visits exploring industrial best practice.
THEMES
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Control of measurement, analysis and testing processes,
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Physical & chemical measurements,
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Regulation, legal metrology, international recognition,
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New metrology and new sectors.
The web site for CIM 2015 : http://www.metrologie2015.com/index-en.html