ICST 2013

 

7th International Conference on Sensing Technology (ICST 2013)

Massey University, New Zealand is pleased to announce that the 7th International Conference on Sensing Technology (ICST 2013) will be held on December 3 to 5, 2013 at Wellington, New Zealand.

ICST 2013 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of sensing technology.

ICST 2013 will include keynote addresses by eminent scientists as well as special, regular and poster sessions.

All papers will be peer reviewed on the basis of a full length manuscript and acceptance will be based on quality, originali ty and relevance. Accepted papers will be published in the conference proceedings.

Topics will include, but are not limited to, the following:

  1. Vision Sensing
  2. Sensors Signal Processing
  3. Sensors and Actuators
  4. Sensors Phenomena and Modelling
  5. Sensors Characterization
  6. Smart Sensors and Sensor Fusion
  7. Electromagnetic Sensors
  8. Chemical and Gas Sensors
  9. Physical Sensors
  10. Electronic Nose Technology
  11. Biological Sensors
  12. Electro-optic Sensors and Systems
  13. Mechanical sensors (inertial, pressure, and tactile)
  14. Nano Sensors
  15. Acoustic, Noise and Vibration Sensors
  16. Wireless Sensors
  17. Optical Sensors (radiation sensors, optoelectronic/photonic sensors, and fibres)
  18. Lab-on chip
  19. Sensor Arrays
  20. Intelligent sensing
  21. Telemetering
  22. Online monitoring
  23. Applications of Sensors (automotive, medical, environmental monitoring, consumer, alarm and security, military, nautical, aeronautical and space sensor systems, robotics, and automation)
  24. Solid State Sensors
  25. Internet-based and other Remote Data Acquisition

Organized by Massey University, New Zealand

Note: The ICST 2013 proceedings will be published with an IEEE catalog number and ISBN .
The proceedings will be submitted for publication in IEEE Xplore and indexing by EI Compendex

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